About Electron Microscopy –
Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM)

Electron microscopes are a collective name for different types of microscopes where electrons are used instead of electromagnetic radiation to obtain images of very small objects.
Using this technique, one can get past the resolution limit of visible light, which allows resolution of individual atoms.
The electron beam is absorbed into the air, so electro-optics and preparations must be enclosed in a vacuum chamber.
The technology is divided into two areas: Transmission electron microscope (TEM) and Scanning electron microscope (SEM).

TEM means that an electron gun accelerates an electron beam that is focused through an electromagnetic condenser lens so that a very thin beam hits the sample to be examined.

SEM is basically inverted in the same way as TEM, but the difference is that the beam is swept across the sample by creating a conical electron beam after passing the condenser lens.

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